Download X-Ray Scattering from Semiconductors by Paul F Fewster PDF

By Paul F Fewster

Fewster (Philips Analytical examine middle, united kingdom) discusses the X-ray scattering tools used for the structural research of a number semiconductor fabrics, emphasizing these structural houses that effect actual houses. The textual content covers the elemental structural features of fabrics, the idea of X-ray scattering, the foundations of the instrumentation, and a couple of examples of analyses. The research part covers bulk semiconductor fabrics, approximately ideal semiconductor multi-layer constructions, mosaic buildings, partly cozy multi-layer constructions, laterally inhomogeneous multi-layers, textured polycrystalline semiconductors, and approximately ideal polycrystalline fabrics.

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