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By Forrest M Mims

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44-47, November 1994. G. Devarayanadurg and M. Soma, “Dynamic test signal design for analog integrated circuits”, Digest of Papers, IEEE/ACM International Conference on Computer-Aided Design (ICCAD-95), pp. 627-630, November 1995. W. Mao, Y. K. Gulati and R. Dandapani, “Test generation for linear analog circuits”, Proceedings, IEEE 1995 Custom Integrated Circuits Conference, pp. 521524, May 1995. S. Mir, M. Lubaszewski and B. Courtois, “Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets”, Journal of Electronic Testing: Theory and Application, Vol.

6) where, ω i is the output of the ith basis function. The Gaussian function ω i ( z ) := exp(− | z − c i | 2 / σ i2 ) , where c i and σ i are the ith centre and width respectively, is usually chosen as the basis function. RBF networks are also capable of universal approximation. In many respects, the approximation properties of RBF networks are similar to those of spline functions. For example, if the centre and width are kept fixed then the RBF networks are linearly parameterised approximators; if they are allowed to vary then RBF networks become nonlinearly parameterised approximators.

In IC models, short and open should be considered as resistive values according to the technology and process [30]. The information provided in the literatures can be used for making test decisions, creating fault models, generating fault lists, and calculating fault coverage in fault simulation. A comprehensive structured approach for testing and fault diagnosis of AMS circuits and systems have not yet materialised. The basic problem with analog IC fault diagnosis is the absence of efficient fault models [31], component tolerances and non-linearities.

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